Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy.
作者： Dmitry Tyutyunnikov , Masatoshi Mitsuhara , Christoph T. Koch
DOI: 10.1016/J.ULTRAMIC.2015.07.003
关键词: Region of interest 、 Misorientation 、 Transmission electron microscopy 、 Diffraction 、 Optics 、 Tilt (optics) 、 Dark field microscopy 、 Orientation (computer vision) 、 Crystal orientation 、 Materials science
摘要: In this paper we introduce an approach for precise orientation mapping of crystalline specimens by means transmission electron microscopy. We show that local values can be reconstructed from experimental dark-field image data acquired at different specimen tilts and multiple Bragg reflections. By using the suggested method it is also possible to determine tilt axis with respect or diffraction pattern. The has been implemented automatically acquire necessary then map crystal a given region interest. have applied technique prepared Ni-based super-alloy CMSX-4. functionality limitations our are discussed compared those other techniques available.
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