SESAM: Exploring the frontiers of electron microscopy
作者： Christoph T. Koch , Wilfried Sigle , Rainer Höschen , Manfred Rühle , Erik Essers
DOI: 10.1017/S1431927606060624
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摘要: We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with monochromator and an in-column MANDOLINE filter. recent results obtained this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or transmissivity of filter T1 ev = 11,000 nm2). New opportunities to do unique experiments that may advance frontiers microscopy in areas such as energy-filtered TEM, spectroscopy, electron diffraction spectroscopic profiling are also discussed.
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