Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing
作者： Z.W. Chen , J.K.L. Lai , C.H. Shek , H.D. Chen
DOI: 10.1016/J.APSUSC.2004.12.022
关键词:
摘要: Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing have been investigated by transmission electron microscopy high-resolution observations. Experimental results indicated that the microstructure of metal Au film plays an important role metal-induced crystallization for annealing. Synchronously, processes amorphous Ge accompanied clusters, which were composed nanocrystals. We found grain boundaries polycrystalline initial nucleation sites High-resolution observations showed successive at near tips. The process was suggested to be diffusion controlled a random growth mechanism.
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