作者: Akira Sugawara , Takashi Kikukawa , Osamu Nittono
DOI: 10.1016/0921-5093(94)90226-7
关键词: Fractal 、 Cluster (physics) 、 Materials science 、 Crystallography 、 Crystallite 、 Fractal dimension 、 Amorphous solid 、 Condensed matter physics 、 Crystallization 、 Layer (electronics) 、 Diffusion
摘要: Abstract The crystallization of amorphous Ge on a polycrystalline Au layer has been investigated by means in situ transmission electron microscopy and scanning Auger microscopy. clusters showed fractal morphology their dimensions decreased with increasing thickness the underlayer. growth size found to obey power law. results suggest that is diffusion controlled atoms Ge-depleted zone surrounding cluster. well explained terms length crystallites