Comparison of the Sensitivity and Image Contrast in Spontaneous Raman and Coherent Stokes Raman Scattering Microscopy of Geometry Controlled Samples
作者： Hyunmin Kim , Chris A. Michaels , Garnett W. Bryant , Stephan J. Stranick
DOI: 10.1117/1.3533310
关键词:
摘要: Abstract. We experimentally compare the performance and image contrast of spontaneous Raman coherentStokes scattering microscopy. demonstrate differences between these techniques on a series ofgeometry-controlled samples that range in complexity from point (array tips) to one-dimensional (line grating)and, lastly, two-dimensional (checkereboard) microstructure. Through use this sample series, comparisonof focal volume, achievable signal-to-noise, resulting is made. The results demonstratethe effciency spatial resolution attainable coherent microscopy relative Ramanmicroscopy. Additionally, we detail potential complications interpretation images ofsample fine structure, where no longer based solely oscillator concentration but can be influencedby C 2011 Society Photo-Optical Instrumentation Engineers (SPIE) . [DOI: 10.1117/1.3533310] Keywords: effects; scattering; scanning microscopy; silicon; imaging.Paper 102988SSR received Jan. 1, 2010; revised manuscript Sep. 13, accepted for publication 15, publishedonline Feb. 9, 2011.
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