作者: Murilo F Cabral , Dyovani Coelho , Sergio AS Machado , None
DOI: 10.1016/J.ELECTACTA.2012.12.084
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摘要: Abstract Cd UPD on selenium was studied for an Au-EQCN modified electrode with Se thin-films previously deposited in acid media. The relationship between AFM, cyclic voltammetry and EQCN data provided analysis of a semiconductive layer. measurements demonstrated that the increase mass during potentiostatic deposition conditions larger than expected maximum recovery allowed (i.e. 0.17 ML), which related to diffusion through thin-film. From AFM it possible normalize voltammetric gravimetric data, our results were consistent controlled electrodeposition CdSe structures. result process amount CdSe. In addition, these findings also can be used as helpful technique order improve control surface engineering.