Electronic states at silicide-silicon interfaces

作者: Paul S. Ho , Edward S. Yang , Howard L. Evans , Xu Wu

DOI: 10.1103/PHYSREVLETT.56.177

关键词:

摘要: A capacitance-spectroscopy technique based on accurate phase detection has been developed to measure the unoccupied states at silicide-silicon contacts. For Pd and Ni silicides, a …

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