作者: S. W. Tong , C. S. Lee , Y. Lifshitz , D. Q. Gao , S. T. Lee
DOI: 10.1063/1.1751220
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摘要: Conducting fluorocarbon coatings (CFx) have recently been used as an anode buffer layer in organic light-emitting diode (OLEDs) for enhancement of stability and carrier injection. The effect CFx on OLEDs was related to its conductivity. We found the resistivity poorly conducting (about 1010 Ω cm) can be substantially decreased 105 Ω cm by either near UV or Ar ion irradiation. were prepared untreated treated performance comparison. treatment improved device performance, while led deterioration. X-ray photoelectron spectroscopy analysis showed created graphitic regions leading higher conductivity but underlying indium tin oxide (ITO) remained intact. In contrast, argon bombardment caused damage ITO which contributed poor although similarly increased.