作者: Furusawa Shinji , Endo Takayuki , Mori Shigeya , Shoda Hisahiro , Takahashi Mari
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摘要: PURPOSE:To reduce sticking of dust to a treated substrate and prevent lowering film-formation rate due residual by feeding activated cleaning gas through reaction induction line into container after forming desired thin film on the surface CVD method. CONSTITUTION:After 3 chemical be fed from introduction lines 15a 15b inside 1, is stopped exhausted followed carrying out film-formed load lock chamber connected container. Next, valve 11 for opened so as let flow activation means 12. Further, this introduced 1. Thereby, product remaining in removed.