Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis
作者： Luca Lutterotti , Roman Vasin , Hans-Rudolf Wenk
DOI: 10.1017/S0885715613001346
关键词:
摘要: … In two on-line attachments, we describe step-by-step procedures for data analysis in MAUD … and much can be done with an automatic wizard in the MAUD software within a few minutes. …
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berkeley.edu 参考文章(26)
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