作者: Xin Sun , Zonghuan Lu , Weiyu Xie , Yiping Wang , Jian Shi
DOI: 10.1063/1.4980088
关键词:
摘要: van der Waals epitaxy (vdWE) of three-dimensional CdS thin films on both single-crystalline graphene/Cu(111)/spinel(111) and graphene/SiO2/Si substrates is achieved via thermal evaporation. X-ray electron backscatter diffraction pole figures reveal that the are a Wurtzite structure with weak graphene accompanied fiber texture background. The epitaxial alignment between observed to be an unusual non-parallel relationship 30° rotation unit vectors graphene. A geometrical model based minimization superlattice area mismatch employed calculate possible interface lattice arrangement. It found indeed most probable alignment. vdWE graphene, transferrable arbitrary substrates, may represent step forward for growth quality through grap...