作者: Sergiu C. Pop , Brenor Brophy , Ralf Schulze , Peter Gonsalves
DOI: 10.1109/PVSC.2016.7749742
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摘要: New technologies enabling higher operating voltages in PV modules and inverters are driving system level improvements, but increasing the risk of potential induced degradation (PID). In this work we extend optimize concept barrier films that previously published [1]. The optimized film, deposited on inside cover glass adjacent to front encapsulate, exhibits ability reduce metal ion migration from hence reducing solar cell degradation. We show our film significantly reduces PID, demonstrating an attractive promising application for producing low-cost PID-resistant especially when used as part ensemble PID reduction technologies.