Evaluating PtSi front contact to surface barrier detectors
作者： S. Petersson , E. Mgbenu , H. Norde , P.A. Tove
DOI: 10.1016/0029-554X(77)90242-7
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摘要: Abstract The rectifying front contact of Si surface barrier detectors is usually an evaporated Au film. properties this may not be optimal in three respects: (a) stability against changing ambient conditions, (b) window thickness and (c) current injection properties. Results are presented measurements made on PtSi contacts, as alternative. We find that while the leakage currents (including temperature dependence) ultimate resolution comparable with typical AunSi results, PtSiSi system less sensitive to touching, has possibilities for small thickness. It suggested some applications, can a viable alternative Au, nuclear radiation detectors, well light detectors.
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