Quantification of tablet sensitivity to a stress concentration: Generalization of Hiestand's approach and link with the microstructure

摘要: Abstract Sensitivity to a stress concentration is important for the development of pharmaceutical tablets as it related defects like capping. The Brittle Fracture Index (BFI) was introduced by Hiestand et al. test this sensitivity. Recently, more general index, based on average criterion, proposed generalized approach. In work, new approach tested obtained several products and pressure levels, results show wide applicability criterion. Furthermore, X-ray micro-computed tomography used link tablet microstructure sensitivity concentration. A strong correlation found between size largest pores in structure value a0 which quantify These constitute first attempt brittle fracture propensity with their effective microstructure.