Multiple-edge EXAFS refinement: Short-range structure in liquid and crystalline Sn

摘要: L-edge extended x-ray-absorption fine structure (EXAFS) spectra of solid and liquid tin have been collected by using synchrotron radiation. Information on local has obtained simultaneous analysis Sn ${\mathit{L}}_{3}$-, ${\mathit{L}}_{2}$-, ${\mathit{L}}_{1}$-edge EXAFS an original data-analysis scheme based the ab initio multiple-scattering GNXAS method. The use three edges allowed extension energy range useful data increasing accuracy derived structural parameters. Details multiple-edge methodology are provided. general interest method for studies monatomic multiatomic systems is discussed. A very good agreement with diffraction found crystalline Sn. first-neighbor distribution studied as a function temperature. Statistical errors parameters model pair g(r) x-ray-diffraction refined in at T=245 \ifmmode^\circ\else\textdegree\fi{}C. signal shown to be sensitive short-range correlations. foot first peak steeper mean distance slightly shorter than previously indicated. Error bars g(r), due random data, also shown. signature three-body assigned covalent tetrahedral configurations evidenced. \textcopyright{} 1996 American Physical Society.