Photoelectron spectroscopic study of X-ray induced reduction of CeO2
作者： M.V. Rama Rao , T. Shripathi
DOI: 10.1016/S0368-2048(97)00087-X
关键词:
摘要: XPS technique is used to study the modification induced in CeO2 on exposure Al Kα X-rays. A of Ce (3d) and O (1s) spectra sintered unsintered pellets ceria with X-ray time carried out investigate effect hydroxyl species reduction CeO2. After prolonged X-rays, a colour change observed sample surface pellet. Results show that sub-stoichiometric oxides occurs at faster rate pellet irradiation.
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