作者: Andrea Irace , Giovanni Breglio , Paolo Spirito
DOI: 10.1016/J.MICROREL.2007.07.012
关键词:
摘要: In this work, we present a novel 3D electro-thermal simulation tool capable of taking into account also particular driving strategies the electron device, as it may be case smart power MOSFETs where control logic interacts with section and controls its dissipated temperature. As an example, thermal shutdown circuit, reading temperature on chip switching device off if latter reaches dangerous values, usually embedded within devices used in automotive applications to drive direction light or small motors/actuators, is simulated validate our approach.