New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs

作者: Andrea Irace , Giovanni Breglio , Paolo Spirito

DOI: 10.1016/J.MICROREL.2007.07.012

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摘要: In this work, we present a novel 3D electro-thermal simulation tool capable of taking into account also particular driving strategies the electron device, as it may be case smart power MOSFETs where control logic interacts with section and controls its dissipated temperature. As an example, thermal shutdown circuit, reading temperature on chip switching device off if latter reaches dangerous values, usually embedded within devices used in automotive applications to drive direction light or small motors/actuators, is simulated validate our approach.

参考文章(2)
A. Irace, G. Breglio, P. Spirito, R. Letor, S. Russo, Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation Microelectronics Reliability. ,vol. 45, pp. 1706- 1710 ,(2005) , 10.1016/J.MICROREL.2005.07.087
G Breglio, P Spirito, Experimental detection of time dependent temperature maps in power bipolar transistors Microelectronics Journal. ,vol. 31, pp. 735- 739 ,(2000) , 10.1016/S0026-2692(00)00052-5