Dynamic built-in self-test system
作者： Amanda R. Kaufer , Ryan A. Fitch , Steven M. Douskey , Michael J. Hamilton
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摘要: A method of performing a dynamic built-in self-test (BIST). The includes first test circuit on semiconductor chip. switch factor. during the is monitored with one or more sensors. sensor value sensors monitoring determined. It also determined whether within range programmable constant. second factor in response to determining that outside
google.de 参考文章(18)
Michael L. Abrams, Ben W. Jones, Jeffery C. Gannon, Scott T. Dupuie, Richard A. Johnson, Franklin W. Mayo, Method and apparatus for generation of test bitstreams and testing of closed loop transducers ,(1997)
Amanda Renee Kaufer, Ryan Andrew Fitch, Steven Michael Douskey, Michael John Hamilton, Implementing switching factor reduction in LBIST ,(2010)
Peter N. Ehlig, Gary L. Swoboda, Processor condition sensing circuits, systems and methods ,(1992)
Yasuo Sato, Kotaro Shimamura, Seiji Kajihara, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue, Yukiya Miura, Satoshi Ohtake, Takumi Hasegawa, Motoyuki Sato, DART: Dependable VLSI test architecture and its implementation international test conference. pp. 1- 10 ,(2012) , 10.1109/TEST.2012.6401581
Benjamin Stolt, Yonatan Mittlefehldt, Sanjay Dubey, Gaurav Mittal, Mike Lee, Joshua Friedrich, Eric Fluhr, Design and Implementation of the POWER6 Microprocessor IEEE Journal of Solid-state Circuits. ,vol. 43, pp. 21- 28 ,(2008) , 10.1109/JSSC.2007.910963
Naoki Kiryu, Programmable scan shift speed control for LBIST ,(2005)
Steven R. Boyle, Anand Dixit, Raymond A. Heald, Method for monitoring and adjusting circuit performance ,(2008)
Tasuku Fujibe, Detection apparatus and test apparatus ,(2007)
Michael D. Bienek, Randal L. Posey, Victor F. Andrade, Michael C. Braganza, Method and apparatus to achieve more level thermal gradient ,(2006)