Method and apparatus for mounting, inspecting and adjusting probe card needles

摘要: A method and apparatus for mounting, inspecting, adjusting probe card needles used during testing of fabricated circuits. build wafer, comprised scrub target patterns, is to mount re-work needle assemblies onto a card. Each composed hard material that resistant scratching, offset preset distance from the position bonding pads on actual wafer be tested. soft easily disturbed by needle's scrubbing action. By counting number lines broken or cut mark, approximate length width mark may ascertained. An adjustment tool designed fit snugly around untapered, thickest portion needle. The rotated along axis shaft, allowing technician "tweak" either up down. In one embodiment, consists three parallel cylinders, triangularly spaced, attached orthogonally end an lever. spacing between cylinders can accommodate diameter