Low profile probe having improved mechanical scrub and reduced contact inductance

摘要: A vertically folded probe is provided that can provide improved scrub performance in cases where the height limited. More specifically, such a includes base and tip, an arm extending from to tip as single continuous member. The folded, it three or more vertical portions. portions have substantial overlap, are laterally displaced each other. When brought down onto device under test, deforms. During deformation, at least two of come into contact with Such between advantageously increase lateral motion also reduce inductance.