Method and apparatus for aligning probes

摘要: This invention presents a method for aligning set of probes in circuit testing apparatus with pads under test and the designed according to this method. The alignment includes steps selecting first group G1 from set, such that all have same tip length L1 beam L2, mounting each probe on block which has through-hole removable portion through-hole. During step is placed through-hole, attached discarded. Then, second G2 selected mounted it manner as block. blocks are top other by using guide holes positioning conjunction corresponding vertical fixing pin tiltable pin.