作者: Adriana Paracchino , Vincent Laporte , Kevin Sivula , Michael Grätzel , Elijah Thimsen
DOI: 10.1038/NMAT3017
关键词:
摘要: … XPS data were collected by an Axis Ultra instrument (Kratos Analytical) under ultrahigh vacuum (<10 −8 torr) and using a monochromatic Al K α X-ray source (1,486.6 eV), in the Surface …