作者: M.A. Gosalvez , K. Sato
关键词:
摘要: Extensive numerical simulations of anisotropic etching exact and vicinal Si(111) are performed for the first time using target rate kinetic Monte-Carlo (TR-KMC) algorithm. The results show that removal layers on is largely controlled by step propagation pit nucleation has a vanishingly small role. In turn, flow itself kink and, only to minor extent, nucleation.