Electron Microscopy of Static and Dynamic Phenomena
作者： G. Van Tendeloo , J. Van Landuyt , S. Amelinckx
DOI: 10.1007/978-3-642-73498-4_2
关键词:
摘要: Due to the unique combination of real space and reciprocal information, electron microscopy is an extremely powerful technique for revealing analysing static or dynamic structural features. With modern microscopes details order 0.2 nm can be directly observed so that defects studied down atomic scale. For a more general introduction on possibilities we refer e.g. [1,2,3]. In this contribution will treat four case studies taken from different types materials; they are meant illustrate combined with diffraction in study phenomena.
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