Effect of Doping on Defect Structure and Phase Stability in Y-Based Cuprates: In-Situ Tem Studies
作者： K. Rajan , R. Garcia , L. C. Gupta , R. Vijayaraghavan
DOI: 10.1007/978-1-4684-7565-4_58
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摘要: Transmission electron microscopy (TEM) studies of defect structure in YBa2Cu3−xMxOy doped with Mg and Zn (M = Mg, Zn) are reported. The material exhibited a large number non-intersecting twins. In-situ heat pulsing experiments the TEM showed that only one twin variants was unstable to annealing. It also found other types planar defects may replace disappearance variants. on hand remarkable microstructural stability in-situ heating experiments. is suggested these results be interpreted terms preferential site occupancy dopants at boundaries.
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