作者: Toshihiko Kiwa , Masayoshi Tonouchi
DOI: 10.1016/S0921-4534(01)00695-5
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摘要: Abstract We measure the complex conductivity σ and surface impedance of c-axis oriented 100-nm-thick YBa2Cu3O7−δ (YBCO) thin films deposited on ( 1 0 )MgO substrates (0.5 mm thick) at frequencies between 0.5 1.5 THz, using time-domain terahertz spectroscopy. The real part decreases with increasing frequency its value is about 2.4×105 (S/m) THz. imaginary increases then monotonically around 750 GHz. YBCO increased decreasing temperature below 60 K. trend enhanced resistance film order 10 −1 Ω temperature. reactance independent in this THz region, less than −3 40