作者: Adithya Prakash , Shraddha D. Nehate , Kalpathy B. Sundaram
DOI: 10.1364/OL.41.004249
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摘要: A metal-insulator-metal (MIM) structure using boron carbon nitride (BCN) was tested for its UV detection capability. Since BCN is one of the hardest and chemically robust materials, it expected to be a potential choice detector in extreme harsh conditions. The thin films were deposited dual target RF magnetron sputtering process. optoelectronic performance MIM devices examined through photocurrent measurements. two orders magnitude higher with respect dark current achieved range −3 3 V.