Novel Computing Method for Short Programming Time and Low Energy Consumption in HfO 2 Based RRAM Arrays

作者: Gilbert Sassine , Carlo Cagli , Jean-Francois Nodin , Gabriel Molas , Etienne Nowak

DOI: 10.1109/JEDS.2018.2830999

关键词:

摘要: This paper proposes a novel technique for reducing programming time and energy consumption in resistive random access memory (RRAM) arrays based on ramped voltage stress (RVS). RVS method is correlated to conventional constant (CVS) using an analytical model validating as reliable switching characterization RRAM arrays. optimized reduce providing quantitative qualitative link between tails improvement Switching distribution much more controlled: half decade comparison with ~3 decades CVS method. Energy reduced by 4 orders of magnitude at $+5\sigma $ quantiles our proposed compared CVS.

参考文章(33)
S. Van Beek, K. Martens, P. Roussel, G. Donadio, J. Swerts, S. Mertens, G. Kar, T. Min, G. Groeseneken, Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions international reliability physics symposium. pp. 4- ,(2015) , 10.1109/IRPS.2015.7112818
M. Prezioso, F. Merrikh-Bayat, B. D. Hoskins, G. C. Adam, K. K. Likharev, D. B. Strukov, Training and operation of an integrated neuromorphic network based on metal-oxide memristors Nature. ,vol. 521, pp. 61- 64 ,(2015) , 10.1038/NATURE14441
Stephan Menzel, Ulrich Böttger, Martin Wimmer, Martin Salinga, Physics of the Switching Kinetics in Resistive Memories Advanced Functional Materials. ,vol. 25, pp. 6306- 6325 ,(2015) , 10.1002/ADFM.201500825
H-S Philip Wong, Heng-Yuan Lee, Shimeng Yu, Yu-Sheng Chen, Yi Wu, Pang-Shiu Chen, Byoungil Lee, Frederick T Chen, Ming-Jinn Tsai, None, Metal–Oxide RRAM Proceedings of the IEEE. ,vol. 100, pp. 1951- 1970 ,(2012) , 10.1109/JPROC.2012.2190369
Myoung-Jae Lee, Chang Bum Lee, Dongsoo Lee, Seung Ryul Lee, Man Chang, Ji Hyun Hur, Young-Bae Kim, Chang-Jung Kim, David H. Seo, Sunae Seo, U-In Chung, In-Kyeong Yoo, Kinam Kim, A fast, high-endurance and scalable non-volatile memory device made from asymmetric Ta2O5−x/TaO2−x bilayer structures Nature Materials. ,vol. 10, pp. 625- 630 ,(2011) , 10.1038/NMAT3070
A. Kerber, L. Pantisano, A. Veloso, G. Groeseneken, M. Kerber, Reliability screening of high-k dielectrics based on voltage ramp stress Microelectronics Reliability. ,vol. 47, pp. 513- 517 ,(2007) , 10.1016/J.MICROREL.2007.01.030
Eike Linn, Roland Rosezin, Carsten Kügeler, Rainer Waser, Complementary resistive switches for passive nanocrossbar memories Nature Materials. ,vol. 9, pp. 403- 406 ,(2010) , 10.1038/NMAT2748
Ernest Y. Wu, Jordi Suñé, Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability Microelectronics Reliability. ,vol. 45, pp. 1809- 1834 ,(2005) , 10.1016/J.MICROREL.2005.04.004
Wun-Cheng Luo, Kuan-Liang Lin, Jiun-Jia Huang, Chung-Lun Lee, Tuo-Hung Hou, Rapid Prediction of RRAM RESET-State Disturb by Ramped Voltage Stress IEEE Electron Device Letters. ,vol. 33, pp. 597- 599 ,(2012) , 10.1109/LED.2012.2185838
Wan Gee Kim, Hyun Min Lee, Beom Yong Kim, Kyoo Ho Jung, Tae Geun Seong, Seonghyun Kim, Ha Chang Jung, Hyo June Kim, Jong Hee Yoo, Hyung Dong Lee, Soo Gil Kim, Suock Chung, Kee Jeung Lee, Jung Hoon Lee, Hyeong Soo Kim, Seok Hee Lee, Jianhua Yang, Yoocharn Jeon, R. Stanley Williams, NbO 2 -based low power and cost effective 1S1R switching for high density cross point ReRAM Application symposium on vlsi technology. pp. 1- 2 ,(2014) , 10.1109/VLSIT.2014.6894405