Prospects for aberration corrected electron precession.

摘要: Recent developments in aberration control the TEM have yielded a tremendous enhancement of direct imaging capabilities for studying atomic structures. However, correction also has substantial benefits achieving ultra-resolution through reciprocal space techniques. Several tools are available that allow very accurate detection electron distribution surfaces allowing precise atomic-scale characterization statistical inversion techniques from diffraction data. The precession technique now appears to extend this capability bulk. This article covers some progress area and details requirements next-generation analytical instrument. An analysis contributions offered by precision is included.