Determination of silicone coating Young's modulus using atomic force microscopy
作者： T. Thomé , S. Fouchez , S. Delalande
DOI: 10.1016/J.PHYSB.2008.09.038
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摘要: Abstract The polymerisation degree of thin polymer coatings was checked by following the variation their local mechanical properties. Atomic force microscope (AFM) used in an indentation mode to investigate characteristics silicone on polycarbonate substrates. evolution Young's modulus determined as a function annealing time. We have relative method measure moduli, which involves calibration step with set reference polymers. No observed for annealed during more than 40 min at 130 °C. This result indicates that over-heating does not modify properties coating.
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