作者: R. Roucka , Y.-Y. Fang , J. Kouvetakis , A. V. G. Chizmeshya , J. Menéndez
DOI: 10.1103/PHYSREVB.81.245214
关键词:
摘要: The temperature dependence of the lattice parameter Ge{sub 1-y}Sn{sub y} alloys deposited on Si substrates has been determined from an analysis their x-ray reciprocal-space maps. It is found that over range 0