Site-specific fracture plane determination using the FIB/TEM.
作者： Robert E. Hackenberg , Robert D. Field , Pallas A. Papin , Jason C. Cooley , David F. Teter
DOI: 10.1016/J.ULTRAMIC.2007.01.008
关键词:
摘要: A new method for the determination of crystallographic indices planar fracture surfaces is described. The key innovation use a focused ion beam instrument to extract two transmission electron microscopy (TEM) foils from surface. Selected area diffraction these in TEM allows plane cross product line directions contained within plane. This be determined relatively small surfaces, affording determinations facets on polycrystalline samples. validation this using cleavage pure zinc
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