Measurement of Strain and Stress Distributions in Structural Materials by Electron Moiré Method

作者: Satoshi KISHIMOTO , Yougming XING , Yoshihisa TANAKA , Yutaka KAGAWA

DOI: 10.1299/JMMP.2.812

关键词:

摘要:

参考文章(4)
Y.M. Xing, Y. Tanaka, S. Kishimoto, N. Shinya, Determining interfacial thermal residual stress in SiC/Ti-15-3 composites Scripta Materialia. ,vol. 48, pp. 701- 706 ,(2003) , 10.1016/S1359-6462(02)00554-7
Satoshi Kishimoto, Qinghua Wang, Huimin Xie, Yapu Zhao, Study of the surface structure of butterfly wings using the scanning electron microscopic moiré method Applied Optics. ,vol. 46, pp. 7026- 7034 ,(2007) , 10.1364/AO.46.007026
Yoshiharu Morimoto, In-Hong Yang, Chen-Gang Gu, Scanning moiré method for obtaining smooth fringe patterns Optics and Lasers in Engineering. ,vol. 24, pp. 3- 17 ,(1996) , 10.1016/0143-8166(95)00068-Y
Xie Huimin, Satoshi Kishimoto, Norio Shinya, Dai Fulong, Zou Daqing, Liu Sheng, Thermal deformation measurement of the solder joints in electronic packages using electron moiré method Strain. ,vol. 35, pp. 127- 130 ,(1999) , 10.1111/J.1475-1305.1999.TB01149.X