Size Quantization in Electrodeposited CdTe Nanocrystalline Films

摘要: We describe the deposition and characterization of nanocrystalline CdTe films which exhibit size quantization. The were electrodeposited from a dimethylsulfoxide solution tri-(n-butyl)phosphine telluride cadmium perchlorate at 100 °C. stoichiometry depends on applied potential composition. contained about 5−10% Te excess exhibited small blue shifts (0.1−0.2 eV) in their optical spectra. XRD electron microscopy indicated typical crystal ca. 8 nm. Pulse reverse plating was used to improve film stoichiometry. nanocrystal could be controlled by pulse parameters, almost stoichiometric with average sizes 4 7 nm obtained, showing increases bandgap up 0.8 eV. Annealing resulted gradual growth corresponding spectral red until bulk reached. X-ray photoelectron spectroscopy (XPS) showed phosphorous incorporation films. cryst...