Highly angular resolved x‐ray photoelectron diffraction measurements from a Ge(111) surface

作者: N. Wakamatsu , K. Tamura , H. Ishii , M. Owari , Y. Nihei

DOI: 10.1002/SIA.1933

关键词:

摘要: Using a high angle-resolving electron energy analyser with novel input lens system, we measured Ge 3p x-ray photoelectron diffraction (XPED) patterns from Ge(111) surface excited by Al Kα changing angular resolution ±0.04° to ±2°, and considered the dependence of XPED experiments theory. Highly resolved containing fine features such as Kikuchi-like bands were obtained. These reproduced theoretical calculations. We also performed calculations for further investigation highly XPED. Copyright © 2004 John Wiley & Sons, Ltd.

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