作者: Richard L. Tober , Thomas B. Bahder
DOI: 10.1063/1.110478
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摘要: The electric field in a [111] growth‐axis strained‐layer quantum well embedded p‐i‐n diode is determined by measuring the polarization vector well. from critical reverse bias necessary to produce zero obtained electroreflectance spectra, which have optical features that exhibit 180° phase change at flat band. A depletion model of with an used relate applied and