作者: Ming Liu , Chunrui Ma , Gregory Collins , Jian Liu , Yamei Zhang
DOI: 10.1016/J.MATLET.2013.07.013
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摘要: Abstract Perovskite cobaltates LaBaCo 2 O 5.5+ δ thin films were directly integrated onto (001) Si substrates by pulsed laser deposition. Microstructural studies from X-ray diffraction reveal that the are polycrystalline. Electrical transport property measurements indicate polycrystalline have a semiconductor behavior with largest magnetoresistance value of 18% at ~40 K. Magnetization show exhibit magnetic similar to its bulk materials nanoscale ordered 6 and larger moments coercive field than single-crystal films.