作者: Wei Ren , Yun Liu , Jihui Qiu , Liangying Zhang , Xi Yao
DOI: 10.1080/00150199408017620
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摘要: Abstract The PLT thin films on silicon substrate were prepared by MOD method. relationship of dielectric constants and loss tangent with annealing temperatures La content investigated. Curie decrease linearly at a rate -17°C/mol% increasing content. Ps, Pr Ec the studied P-E hysteresis loops. Large value 19.61μC/cm2 has been achieved in PLTS films, while is 164KV/cm, which much higher than that bulk materials.