Electric-field-induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111)
作者： Lukas Gerhard , Moritz Peter , Wulf Wulfhekel
DOI: 10.1103/PHYSREVB.91.184107
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摘要: We present a detailed study of an electric-field induced phase transition single layer Fe on Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and follow from face-centered cubic hexagonal closepacked stacking with atomic resolution.
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sci-hub.se 参考文章(17)
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