作者: Htay Hlaing , Chang-Yong Nam , Kevin G. Yager , Charles T. Black , Benjamin M. Ocko
DOI: 10.1021/CM502950J
关键词:
摘要: In this work, we have used synchrotron-based grazing incidence X-ray scattering to measure the molecular orientation and morphology of nanostructured thin films of blended poly (3 …