作者: John D. Cressler , Chung Hang John Poh , John Papapolymerou , Duane C. Howard , Peng Cheng
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摘要: A novel de-embedding method using a full-wave electromagnetic (EM) simulated pad model is proposed to de-embed the parasitics from test structure at high frequencies. The conventional methods “open-short” approach and “symmetrical-line” are prone error frequencies, while EM-simulated-pad presented here shows improved accuracy good agreement with EM simulations result up 67 GHz.