Local hydrogen hopping and long‐range diffusion in Nb films: An electrical noise study
作者： B. D. Nevins , M. B. Weissman
DOI: 10.1063/1.351767
关键词:
摘要: The low‐frequency resistance noise of thin Nb films was studied at temperatures from 60 to 400 K. This came predominantly hydrogen‐ion motions, as can be shown by draining ions out the sample with an electric field. In addition long‐range diffusion and large‐scale collective motion noise, which have been described previously, found near 150 K, due local hydrogen hopping similar that observed in several other materials. However, unlike some materials, a different type than those give diffusion.
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