作者: Benedikt W. Graf , Steven G. Adie , Stephen A. Boppart
DOI: 10.1364/OL.35.003120
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摘要: We present a method for correcting coherence gate curvature caused by scanning-induced path length variations in spectral-domain high-NA optical imaging systems. These cause artifacts tomography and effectively restrict the field of view microscopy (OCM). Here we show that can be measured corrected recovering phase analytic signal from calibration image. This information used directly to process OCM images allowing curvature, as well any order system dispersion, computationally efficient manner. also discuss use various image quality metrics adjust calibrated keep confocal gates aligned tissue.