作者: M Nikolaeva , M Sendova-Vassileva , D Malinovska , Y Sarov , J.C Pivin
DOI: 10.1016/S0168-583X(02)00917-5
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摘要: Abstract Ag nanoclusters in SiO 2 matrix were formed by magnetron co-sputtering followed ion irradiation. The refractive index and optical extinction spectra of the films studied. :Ag thin exhibit a plasmon resonance visible region. In as-deposited are less then 0.5 nm size. intensity peak is low. After irradiation with 4.5 MeV Au ions increases it becomes narrower. FWHM corresponds to mean radius increasing fluence. method disappearing diffraction pattern was used for determination. It critical angle applicable measurements layers thickness comparable wavelength. Moreover insensitive surface gradients real part roughness, which disturb elipsometric data. enhances concentration fluence, as expected from light scattering theory.