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作者: Hayashi , Hayashi , Neyishi , Matsushita , Yagino
DOI: 10.1109/ISSCC.1988.663721
关键词:
摘要:
Solid-state Electronics,2003, 引用: 15
Semiconductor Science and Technology,2000, 引用: 8
Solid-state Electronics,2004, 引用: 5
design and diagnostics of electronic circuits and systems,2012, 引用: 0
IEEE Transactions on Electron Devices,1991, 引用: 152
IEEE\/OSA Journal of Display Technology,2006, 引用: 1
IEEE Electron Device Letters,1989, 引用: 9
IEEE Transactions on Device and Materials Reliability,2006, 引用: 33
IEEE Transactions on Electron Devices,2007, 引用: 12
international conference mixed design of integrated circuits and systems,2012, 引用: 0