A Super Thin Film Transistor in Advanced Poly Si Films

作者: Takefumi Ohshima , Takashi Noguchi , Hisao Hayashi

DOI: 10.1143/JJAP.25.L291

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摘要: A super thin film transistor (SFT), the active layer poly Si of which is 150–200 thick, advanced by Si+ implantation and solid phase growth. Poly films were amorphized implantation, then regrown annealing at 600°C in N2 atmosphere for 15 hrs. The maximum grain size increases to 1 µm electrical properties are advanced. SFT's fabricated using this technique, Si- dose acceleration energy dependence field effect mobility µFE evaluated. more than 100 cm2/Vs obtained 40 keV above 2×1015/cm2 800 thick before oxidation.

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