Method and apparatus to provide a burn-in board with increased monitoring capacity

摘要: A method and apparatus are described for allowing the testing monitoring of an increased number devices on a standard burn-in board by implementing PLD group switches to get result multiplexor board. The test data output (TDO) signals from intergrated circuit segmented into groups, with each TDO transmitted particular switches. programmable logic device is coupled groups such that specific may be selected transmit remaining selected, in turn, until all have been transmitted. Thus, transmitted, serially, via limited channels.