Method of and system for functionally testing multiple devices in parallel in a burn-in-environment
作者： Timothy J. Eby , Michael J. Hamilton , Norman K. James , Jason T. Albert , William T. Bronk
DOI:
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摘要: A method of and a system for testing semiconductor devices heat plurality to burn-in temperature, perform functional tests in parallel on the at temperature. Systems include oven test multiplexer. The is adapted receive multiplexer apply signals output from oven.
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