作者: David R. Nygren
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摘要: An apparatus and method for detecting an x-ray determining the depth of penetration into a semiconductor strip detector. In one embodiment, detector formed material is disposed in edge-on orientation towards source such that x-rays From are incident upon substantially perpendicular to front edge The plurality segments. segments coupled together collinear arrangement has length great enough all on interact with which forms A electrodes connected detect or each at least thereto. signal processor also electrodes. present detects interaction within detector, between material, indicates time interaction.