Potential Induced Degradation of solar cells and panels
作者： S. Pingel , O. Frank , M. Winkler , S. Daryan , T. Geipel
DOI: 10.1109/PVSC.2010.5616823
关键词:
摘要: Since solar energy generation is getting more and important worldwide PV systems parks are becoming larger consisting of an increasing number panels being serially interconnected. As a consequence frequently exposed to high relative potentials towards ground causing High Voltage Stress (HVS). The effect HVS on long term stability depending the leakage current between cells has been first addressed by NREL in 2005 [1]. This potential degradation mechanism not monitored typical tests listed IEC 61215 [2]. Depending technology different types Potential Induced Degradation (PID) occur. paper focusing PID wafer based standard p-type silicon aiming life times for once external field. A test setup presented simulation lab influence cell properties demonstrated order reveal precondition PID. However, can also be stopped or minimized panel system level as shown paper.
solon.com 参考文章(6)
W. Sekulic, D. Trudell, J. A. del Cueto, Capabilities of the High Voltage Stress Test System at the Outdoor Test Facility Related Information: Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-1020060-2245; NREL/CD-520-38577). ,(2005)
T. J. McMahon, G. J. Jorgensen, Electrical Currents and Adhesion of Edge-Delete Regions of EVA-to-Glass Module Packaging: Preprint ,(2001)
R. G. Ross, A. R. Hoffman, Environmental qualification testing of terrestrial solar cell modules photovoltaic specialists conference. pp. 835- 842 ,(1978)
Michael Wittner, Timo Weber, William Richardson, Ben Striner, Nicola Baggio, Global Test Site Network paves the way to the optimal site-related photovoltaic solution 2010 35th IEEE Photovoltaic Specialists Conference. pp. 002735- 002739 ,(2010) , 10.1109/PVSC.2010.5616844
R.G. Ross, G.R. Mon, L.C. Wen, R.S. Sugimura, Measurement and characterization of voltage- and current-induced degradation of thin-film photovoltaic modules Solar Cells. ,vol. 27, pp. 289- 298 ,(1989) , 10.1016/0379-6787(89)90037-9
M. Kasemann, W. Kwapil, M.C. Schubert, H. Habenicht, B. Walter, M. The, S. Kontermann, S. Rein, O. Breitenstein, J. Bauer, A. Lotnyk, B. Michl, H. Nagel, A. Schutt, J. Carstensen, H. Foll, T. Trupke, Y. Augarten, H. Kampwerth, R.A. Bardos, S. Pingel, J. Berghold, W. Warta, S.W. Glunz, Spatially resolved silicon solar cell characterization using infrared imaging methods photovoltaic specialists conference. pp. 1- 7 ,(2008) , 10.1109/PVSC.2008.4922478